Reliability and Safety Challenges of Automotive Devices


Recent years, to enhance automotive functionalities for more driving enjoyment and hazard prevention, more and
more electronic devices are used to monitor and control automotive operation. To ensure the safety of drivers and
passengers, these electronic devices need higher reliability. In this talk, we will present what Mentor Graphics are
doing to prepare for these reliability and safety challenges in pre-silicon, post-silicon and system operations.


About the Speaker

Wu-Tung Cheng is a Chief Scientist and Advanced Test Research Director in Mentor Graphics.
He is an IEEE fellow since year 2000. He has over 150 publications and 50 patents in
semiconductor manufacture test and diagnosis area. In 2006, he received ITC best paper award.
In 2008, he received ITC honorable mention award. In 2014, he received ATS best paper award.
He received his Ph.D. degree in Computer Science from the University of Illinois at
Urbana-Champaign in 1985.

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