Submission Information

The workshop is co-located with the ACM/IEEE DATE 2016 conference in Dresden, Germany and will include talks from industry experts. We are soliciting short papers to be presented during a poster-session. Authors are invited to submit a 2-4 page short paper (using the standard IEEE two-column conference format) on topics related to:

  • Early reliability modeling for complex silicon devices
  • Advanced Modeling of degradation effects (HCI, xBTI, EM) and variability
  • EDA flows and design tools for analyzing the effects of variability and aging
  • Assessment of semiconductor degradation and failure effects on embedded and safety critical systems
  • Modeling of the effects of environment, mission profile and workload on reliability

Papers can be submitted using EasyChair at this address : Papers will be distributed on-line and through printed workshop proceedings but authors retain the copyright of their work.

Important Dates

Submission Deadline: December 4th 2015 CLOSED

Author Notification: December 14th 2015 CLOSED

Final Paper Submission: January 29th 2016February 7th. CLOSED